Observation of I-V curves as well as applied waveforms of voltage and current

Application of the current and voltage pulses in the high current mode

		The pulse widths of the applied current and voltage and the measurement point can be specified in the range from 50 to 400 μs (CS-3200 and CS-3300).

Example of measuring MOSFET “current vs. voltage” characteristics

SWEEP TYPE can be selected

SWEEP TYPE can be selected from DOWN, UP, and CUSTOM (all models). With CUSTOM specified, the range between specified values can be swept.

CS-800 semiconductor parameter search (optional)

This is the main unit software option that supports the voltage and current limit function, as well as automatic Vth measurement.

■LIMIT SWEEP If voltage and current limit values are specified before the SWEEP operation, the operation stops at the next measurement point after the limit value is exceeded.

	■Vth and hFE SETUP Vth and hFE can be automatically measured.
Example of automatic Vth measurement

Remote tool

If the use of USB memory is not permitted for security reasons, a copy of the screen, measurement results in the CSV format, and other data can be directly transferred to the PC via LAN. * The remote software is provided at free. However, an NI VISA library (which is not free) is necessary to use this software.

CS-810 semiconductor parameter measurement (optional)

This is a PC application used to connect the main unit incorporating CS-800 and an (optional) PC by a LAN. This application automatically performs measurement by applying the measurement conditions specified using the PC to determine whether data is appropriate.